Framing The Problem While materials form the foundation of semiconductor devices, advances in dev...
Abstract Synchrotron X-ray-based in situ metrology is advantageous for monitoring the synthesis o...
BUFFALO, N.Y. – Companies face unprecedented challenges in the current economy: rising costs, dir...
BQP (BosonQ Psi) and materialsIN, two deep-tech ventures based in Upstate New York, have part...
Traditional quality assurance (QA) approaches are being confronted with the ever-increasing speed...
Abstract This paper describes a database framework that enables one to rapidly explore systematic...